Hantek Electronic Co Ltd
Hantek High-Frequency Magnetic Near Field Probes - Precise EMI Analysis
Hantek High-Frequency Magnetic Near Field Probes - Precise EMI Analysis
SKU: NFPA-1
Zahlungsmethoden
- Banküberweisung
Verfügbarkeit für Abholungen konnte nicht geladen werden
Key Features
Overview
The Hantek High-Frequency Magnetic Near Field Probes are essential for engineers seeking to analyse electromagnetic interference (EMI) and debug electronic designs. These probes enable accurate near-field measurements, providing critical insights into magnetic field distribution. With an operational frequency range from 30MHz to 3GHz, these probes can capture high-frequency emissions. The set includes two probes: one for general magnetic field measurements and another for pinpointing specific sources of magnetic interference, ensuring versatile application in electronic design. The probes are compatible with various oscilloscopes, making them indispensable to any professional engineer's toolkit.
Note: Space is included in the carry case for the Hantek Preamplifier
Downloads
User Manuals
| Ordering information | |
|---|---|
| Part number (SKU) | NFPA-1 |
| Manufacturer | Hantek Electronic Co Ltd |
| EAN | 5055383602605 |
| Warranty | 12 months |
| Shipping weight | 1.0 kg |
- 1 ×HNFP-1 high-frequency magnetic near-field probe
- 1 ×HNFP-2 high-frequency magnetic near-field probe
- 1 ×HNFP-3 high-frequency magnetic near-field probe
- 1 ×HNFP-4 high-frequency magnetic near-field probe
- 2 ×SMA female to N male adaptor
- 1 ×RF cable, approx. 1 m
Questions and Answers
No questions have been asked about this product yet. Ask our engineers below and we'll reply by email.
