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TESTEC Elektronik GmbH

TESTEC TT-HX 212 350MHz Passive Oscilloscope Probe

TESTEC TT-HX 212 350MHz Passive Oscilloscope Probe

High-Voltage Passive Probe with Switchable 1:1/10:1 Attenuation for Precision Measurements
SKU: 12110
Normaler Preis
£60.00 GBP ohne MwSt
Normaler Preis Verkaufspreis
£60.00 GBP ohne MwSt
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Key Features

Dual attenuation modes
400v cat ii safety rating with 1500v transient overvoltage protection.
Switchable 1:1/10:1 attenuation for versatile voltage range compatibility.
Low input capacitance (13pf) minimises circuit interference.
Iec 61010-031 compliance ensures adherence to industrial safety standards.
Integrated compensation trimmers for precise waveform calibration.
1.2m reinforced cable with ergonomic finger guard for secure handling.

Overview

The Testec TT-HX 212 is a professional-grade passive oscilloscope probe designed for high-frequency signal analysis in demanding electronic test environments. Part of the TT-HX series, this probe delivers 350MHz bandwidth in 10:1 attenuation mode, making it ideal for applications requiring precise voltage measurements up to 400Vrms (CAT II). Its switchable 1:1/10:1 attenuation ensures versatility across low- and high-voltage scenarios, while the 10MΩ input impedance minimises circuit loading.

Engineered for reliability, the TT-HX 212 features a rugged 1.2m cable with integrated compensation adjustments for optimal waveform fidelity. Compliant with IEC 61010-031 safety standards, it supports transient overvoltages up to 1500V, making it suitable for industrial and laboratory use. Compared to the TT-HX 312 variant, this model prioritises high-frequency performance, offering a faster rise time of 1ns for accurate capture of rapid signal transitions.

For engineers seeking a cost-effective solution without compromising accuracy, the TT-HX 212 combines durability, safety certifications, and compatibility with 1MΩ BNC oscilloscope inputs. Its ergonomic design includes a sharp tip for fine-point probing and a finger guard for enhanced user safety during extended testing sessions.

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