Testeur de tension Altonovus OhmRanger-LCV

Applies only 206 mV or 380 mV to the DUT, dramatically reducing risk of forward-biasing junctions or stressing cryogenic devices. Select the limit appropriate to your technology and keep measurement stimulus predictable, repeatable, and within device-specific safe operating boundaries always.

Covers 10 Ω to beyond 100 MΩ in a single handheld instrument, eliminating range gaps common in bench DMMs. Confidently measure wiring, thin films, sensors, and device contacts without switching tools, while the display reports measured current and computed resistance.

Built-in current limiting to approximately 30 mA helps protect low-impedance devices and fragile junctions during test. Prevent accidental overstress from unexpected shorts or user mistakes, and maintain consistent test conditions when characterising contacts, interconnects, or cryogenic components at low temperatures.

SNR readout quantifies noise on each measurement and shows min/max current samples, revealing instability, pickup, or DUT nonlinearity. Use it to optimise fixturing, shielding, and cabling, helping you reach repeatable results faster without separate instrumentation or time-consuming analysis or external software.

Fully isolated micro-USB interface allows PC control and data export using standard SCPI commands, avoiding ground loops and measurement corruption. Integrate the meter into automated test scripts safely, preserve instrument portability, and log readings for later analysis without additional adapters.

Operates from two AA cells for around one hundred fifty hours, with backlight and auto power-off options to extend life. Keep tests running in the lab or field without frequent charging, and avoid mains-related interference during sensitive resistance measurements entirely.

Updates approximately every four hundred milliseconds, averaging one hundred sixty samples to reduce 50/60 Hz hum and random noise. See stable results faster, hear the beep-read indicator, and move through test points efficiently when screening devices or documenting process parameters.