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Hantek Electronic Co Ltd

Hantek High-Frequency Magnetic Near Field Probes - Precise EMI Analysis

Hantek High-Frequency Magnetic Near Field Probes - Precise EMI Analysis

Analyse Electromagnetic Interference with Precision
SKU: NFPA-1
Regular price
€311,95 EUR exc tax
Regular price Sale price
€311,95 EUR exc tax
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Key Features

Operational frequency range
Versatile probe set
Wide oscilloscope compatibility: works with many oscilloscopes, enhancing usability.
Magnetic field analysis: enables precise magnetic field distribution mapping.
Emi debugging
High sensitivity
Robust design

Overview

The Hantek High-Frequency Magnetic Near Field Probes are essential for engineers seeking to analyse electromagnetic interference (EMI) and debug electronic designs. These probes enable accurate near-field measurements, providing critical insights into magnetic field distribution. With an operational frequency range from 30MHz to 3GHz, these probes can capture high-frequency emissions. The set includes two probes: one for general magnetic field measurements and another for pinpointing specific sources of magnetic interference, ensuring versatile application in electronic design. The probes are compatible with various oscilloscopes, making them indispensable to any professional engineer's toolkit.

Note:  Space is included in the carry case for the Hantek Preamplifier

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