Hantek Electronic Co Ltd
Hantek High-Frequency Magnetic Near Field Probes - Precise EMI Analysis
Hantek High-Frequency Magnetic Near Field Probes - Precise EMI Analysis
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Key Features
- Operational Frequency Range: From 30MHz to 3GHz for comprehensive high-frequency analysis.
- Versatile Probe Set: Includes two probes for general and pinpoint magnetic field measurements.
- Wide Oscilloscope Compatibility: Works with many oscilloscopes, enhancing usability.
- Magnetic Field Analysis: Enables precise magnetic field distribution mapping.
- EMI Debugging: Facilitates the identification and resolution of electromagnetic interference.
- High Sensitivity: Ensures accurate detection of magnetic field changes.
- Robust Design: Built to withstand rigorous professional use.
The Hantek High-Frequency Magnetic Near Field Probes are essential for engineers seeking to analyse electromagnetic interference (EMI) and debug electronic designs. These probes enable accurate near-field measurements, providing critical insights into magnetic field distribution. With an operational frequency range from 30MHz to 3GHz, these probes can capture high-frequency emissions. The set includes two probes: one for general magnetic field measurements and another for pinpointing specific sources of magnetic interference, ensuring versatile application in electronic design. The probes are compatible with various oscilloscopes, making them indispensable to any professional engineer's toolkit.
Hantek High-Frequency Magnetic Near Field Probes - Precise EMI Analysis
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