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Micsig

Micsig Hochspannungs-Differenzial-AC/DC-Stromsonde (DP-Serie)

Micsig Hochspannungs-Differenzial-AC/DC-Stromsonde (DP-Serie)

+/- 1 % Genauigkeit
SKU: DP700
Bandbreite
Isolationsspannung
Normaler Preis
€244,95 EUR ohne MwSt
Normaler Preis Verkaufspreis
€244,95 EUR ohne MwSt
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Key Features

  • Bandwidth options: 100MHz / 150MHz / 200MHz / 300MHz / 400MHz / 500MHz
  • Maximum voltage ratings: 700Vpk / 1500Vpk / 3000Vpk / 7000Vpk
  • Excellent bandwidth flatness: <0.5dB amplitude fluctuation within half bandwidth
  • High CMRR: >-60dB @ 100KHz
  • 5MHz bandwidth limit function (on select models)
  • Compact design with strong anti-interference metal housing
  • Compatible with any oscilloscope via standard BNC interface
Vollständige Details anzeigen

Overview

The Micsig DP Series High-Voltage Differential Probe is a cutting-edge measurement tool designed for professional engineers working with high-frequency and high-voltage signals. Utilising Micsig's advanced SigOFIT™ technology, this probe offers exceptional performance with a very low noise floor, excellent amplitude-frequency characteristics, and industry-leading common mode rejection capability.

Available in bandwidths ranging from 100MHz to 500MHz and maximum voltage ratings from 700Vpk to 7000Vpk, the DP Series caters to a wide array of testing requirements. Its compact 2cm-thick body, protected by a metal housing, ensures strong anti-interference ability and durability in demanding environments.

Engineers will appreciate the probe's high input impedance (>8MΩ) and low input capacitance (<8pF), which minimise load effects and improve measurement accuracy. The standard BNC interface ensures compatibility with any oscilloscope, while features like one-press auto zero, dual-range selection, and overload alarm enhance usability and safety.

Ideal for applications such as floating measurements, high voltage isolation tests, switching power supply design, and motor drive analysis, the Micsig DP Series is an essential tool for engineers seeking precise, reliable measurements in complex electronic systems.

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