ZeroPlus Technology Co Ltd
ZeroPlus LAP-PROBE-20 Testgreifer
ZeroPlus LAP-PROBE-20 Testgreifer
SKU: LAP-PROBE-20
Verfügbarkeit für Abholungen konnte nicht geladen werden
Key Features
Overview
Professional Test Grabbers for Precision Logic Analysis
The ZeroPlus LAP-PROBE-20 Test Grabbers represent a complete set of 20 high-quality test probes engineered specifically for logic analyzers and digital test equipment. These professional-grade grabber probes provide the reliable signal acquisition essential for electronic design engineers working on embedded systems, protocol analysis, and digital circuit debugging.
Superior Signal Integrity
Each test grabber features optimized impedance characteristics and minimal capacitive loading to ensure accurate signal capture without compromising the device under test. The probes maintain signal integrity at high frequencies whilst providing the mechanical reliability required for professional laboratory and field environments.
Hands-Free Testing Capability
Unlike traditional needle probes, these grabber-style probes secure firmly to test points, component pins, and wire connections, enabling hands-free operation during complex multi-channel logic analysis sessions. The spring-loaded mechanism ensures consistent electrical contact whilst protecting delicate components from damage.
This comprehensive set of 20 test grabbers complements the ZeroPlus logic analyzer family, including the LAP-F1 and LAP-C series, providing engineers with the complete probing solution for professional digital system validation and troubleshooting.
Why Engineers Choose The ZeroPlus LAP-PROBE-20 Testgreifer
Signal Integrity Assurance
Enhanced Productivity
Long-Term Reliability
Ersatzsatz mit 20 Prüfspitzen für Logikanalysatoren und Testgeräte.
Frequently Asked Questions
Have a Question?
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Can these probes be used with other manufacturers' logic analyzers?
Yes, whilst optimised for ZeroPlus equipment, these probes feature standard electrical characteristics compatible with most logic analyzers requiring similar impedance and voltage specifications.
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What maintenance is required for these test grabbers?
Minimal maintenance is required - simply keep contacts clean using isopropyl alcohol and inspect for mechanical wear. The robust construction ensures long service life under normal professional usage conditions.
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How do these grabbers compare to traditional needle probes?
Unlike needle probes requiring manual positioning, these grabbers provide hands-free operation with spring-loaded contacts that maintain consistent connection. This eliminates measurement errors from probe movement and enables multi-channel analysis sessions.
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What voltage levels can these probes safely handle?
The LAP-PROBE-20 probes are designed for standard digital logic voltage levels from 1.8V to 5V systems. They feature appropriate voltage tolerance and ESD protection for safe operation with typical embedded systems and digital circuits.
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Can these grabbers connect to fine-pitch components and small test points?
The grabber mechanism is designed to accommodate various test point sizes including component leads, through-hole pins, and standard PCB test points. For extremely fine-pitch components, consider specialised micro-grabber probes.
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How much capacitive loading do these probes add to the circuit under test?
The probes feature low-capacitance design with minimal loading characteristics to preserve signal integrity. Specific capacitance values are optimised for typical digital logic voltage levels whilst maintaining proper impedance matching.
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What is the maximum frequency these probes can accurately capture?
The LAP-PROBE-20 probes maintain signal integrity for frequencies up to 100MHz, making them suitable for most digital logic applications including microcontroller debugging, communication protocol analysis, and general digital circuit testing.
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Are these test grabbers compatible with all ZeroPlus logic analyzer models?
Yes, the LAP-PROBE-20 test grabbers are designed for universal compatibility with all ZeroPlus logic analyzer models, including the LAP-F1, LAP-C Pro, and LAP-C Standard series. They connect via the standard probe interface.