Discover unparalleled electromagnetic interference (EMI) detection precision with the Hantek Low-Frequency Magnetic Near Field Probe Set. Tailored for professional design engineers, this comprehensive set includes an array of probes meticulously designed for accurate electromagnetic noise measurement. Each probe, ranging from 10cm to 30cm in length, is crafted to capture magnetic fields with exceptional sensitivity, ensuring reliable data collection for low-frequency emissions between 9KHz to 50MHz. The kit's broad bandwidth capabilities enable thorough analysis of various electronic devices, making it an indispensable tool for diagnosing and mitigating EMI issues in your projects.
Featuring high-quality construction, these probes offer robust performance in the most demanding applications. Their ergonomic design provides ease of use, allowing for efficient and effective near-field measurements. The versatility of the Hantek Near Field Probes suits them for a broad spectrum of applications, from PCB layout assessments to interference source localization in complex systems. Elevate your debugging process, enhance your electronic designs, and ensure your products meet electromagnetic compliance standards with this essential kit from Hantek.
Note: Space is included in the carry case for the Hantek Preamplifier