# Title: ZeroPlus LAP-PROBE-20 Test Grabbers
## Description: -
## Product type: Logic Analyser Accessory
## Vendor: ZeroPlus Technology Co Ltd
## Tags: Accessory, Logic Analyser Accessory, zeroplus-technology-co-ltd
## Price range: 73.7 - 73.7 GBP
## Link: https://thedebugstore.com/products/lap-probe-20-test-grabbers-zeroplus-uk
## Options
- Title: Default Title
## Collections
- [New Products](https://thedebugstore.com/a/llms/collections/new-products-debug-store)
- [Zeroplus Technology Co.](https://thedebugstore.com/a/llms/collections/zeroplus-technology-logic-analysers-catalogue)
## Variants
- Default Title, SKU: LAP-PROBE-20, Available: yes, Inventory: 51
## Metafields
- description_tag: Professional ZeroPlus LAP-PROBE-20 test grabbers for logic analyzers. Set of 20 spring-loaded probes ensure reliable signal capture with minimal loading. Essential for digital design engineers. Shop at Debug Store.
- title_tag: ZeroPlus LAP-PROBE-20 Test Grabbers - 20 Logic Analyzer Probes
- manufacturer: ZeroPlus Technology Co Ltd
- warranty: 12 months
- amazon_enable: TRUE
- amazon_title: LAP-PROBE-20 Test Grabbers
- amazon_product_type: computercomponent
- amazon_block: FALSE
- amazon_prime_enable: FALSE
- amazon_search: ZeroPlus
- amazon_uk_price: 73.7
- amazon_uk_currency: GBP
- amazon_de_currency: EUR
- amazon_de_price: 83.281
- amazon_fr_currency: EUR
- amazon_fr_price: 83.281
- amazon_es_currency: EUR
- amazon_es_price: 83.281
- amazon_nl_currency: EUR
- amazon_nl_price: 83.281
- amazon_it_currency: EUR
- amazon_it_price: 83.281
- amazon_se_curency: SEK
- amazon_se_price: 840.18
- amazon_product_id: 5055383606528
- amazon_product_id_type: EAN
- amazon_update: Update
- amazon_short_description: Spare set of 20 Test Probes for Logic Analysers and Test Equipment.
- amazon_long_description: Spare set of 20 Test Probes for Logic Analysers and Test Equipment.
- amazon_main_image: https://www.thedebugstore.com/images/product/Large-ZeroPlus-Probes-20.jpg
- amazon_browse_node: 428655031
- related_products: LAP-PROBE-10,TP240141,TP240212,TP240411,TP120112,TP120212,USBEE-SX,LAP-C-16032,LAP-C-16128,LAP-C-322000
- mpn: LAP-PROBE-20
- backorder_label: If no stock is shown above, order now and we'll ship within 10 working days.
- google_product_category: 1624
- condition: new
- custom_product: false
- mpn: LAP-PROBE-20
- google_product_category: Electronics
- custom_label_0: Logic Analyser Accessory
- warranty: 12 months
- brand: ZeroPlus
- manufacturer: ZeroPlus Technology Co Ltd
- badge: No reviews
- widget:
- brands: gid://shopify/Metaobject/56258494687
- breadcrumbs: ["gid://shopify/Collection/267180835005","gid://shopify/Collection/241171988669"]
- customhs_code: 903040
- detailed_description: {"type":"root","children":[{"type":"paragraph","children":[{"type":"text","value":"Spare set of 20 Test Probes for Logic Analysers and Test Equipment."}]}]}
- key_feature_1: Professional test grabber probes designed for precise signal acquisition and hands-free testing with ZeroPlus logic analyzers and test equipment.
- key_feature_2: Spring-Loaded Grab Mechanism
- key_feature_2_tooltip: {"type":"root","children":[{"type":"paragraph","children":[{"type":"text","value":"Secure spring-loaded contacts ensure consistent electrical connection to test points, component pins, and wires without requiring constant manual pressure or positioning adjustment."}]}]}
- key_feature_3: Minimal Capacitive Loading
- key_feature_3_tooltip: {"type":"root","children":[{"type":"paragraph","children":[{"type":"text","value":"Low-capacitance design preserves signal integrity at high frequencies, preventing distortion of fast digital edges and ensuring accurate logic level detection and timing measurements."}]}]}
- key_feature_4: Professional Grade Construction
- key_feature_4_tooltip: {"type":"root","children":[{"type":"paragraph","children":[{"type":"text","value":"Robust mechanical design withstands repeated connections and disconnections whilst maintaining electrical performance, providing long-term reliability in demanding laboratory and field environments."}]}]}
- key_feature_5: Universal Test Point Compatibility
- key_feature_5_tooltip: {"type":"root","children":[{"type":"paragraph","children":[{"type":"text","value":"Versatile grabber tips accommodate various test point sizes and geometries including component leads, wire connections, and PCB test pads for maximum flexibility."}]}]}
- key_feature_6: Hands-Free Operation
- key_feature_6_tooltip: {"type":"root","children":[{"type":"paragraph","children":[{"type":"text","value":"Self-securing design eliminates need to hold probes manually during testing, enabling multi-channel acquisitions whilst freeing engineers to focus on analysis and debugging tasks."}]}]}
- key_feature_7: ZeroPlus Logic Analyzer Integration
- key_feature_7_tooltip: {"type":"root","children":[{"type":"paragraph","children":[{"type":"text","value":"Specifically engineered for optimal performance with ZeroPlus logic analyzers including LAP-F1 and LAP-C series, ensuring proper impedance matching and signal fidelity preservation."}]}]}
- key_feature_8_tooltip: {"type":"root","children":[{"type":"paragraph","children":[{"type":"text","value":"Comprehensive probe collection provides sufficient quantities for complex multi-channel digital system analysis whilst including spare probes for replacements and simultaneous project requirements."}]}]}
- key_feature_8: Complete 20-Piece Set
- why_people_choose_3_title: Long-Term Reliability
- why_people_choose_2_title: Enhanced Productivity
- why_people_choose_1_title: Signal Integrity Assurance
- why_people_choose_1: Professional-grade probes maintain high-frequency signal integrity essential for accurate digital system debugging and protocol analysis.
- why_people_choose_3: Robust construction and spring-loaded contacts provide consistent performance through thousands of connections in demanding professional environments.
- why_people_choose_2: Hands-free grabber design enables multi-channel testing whilst eliminating probe positioning distractions during complex analysis sessions.
- 1564380: Are these test grabbers compatible with all ZeroPlus logic analyzer models?***SIMP***Yes, the LAP-PROBE-20 test grabbers are designed for universal compatibility with all ZeroPlus logic analyzer models, including the LAP-F1, LAP-C Pro, and LAP-C Standard series. They connect via the standard probe interface.
- 1564381: What is the maximum frequency these probes can accurately capture?***SIMP***The LAP-PROBE-20 probes maintain signal integrity for frequencies up to 100MHz, making them suitable for most digital logic applications including microcontroller debugging, communication protocol analysis, and general digital circuit testing.
- 1564382: How much capacitive loading do these probes add to the circuit under test?***SIMP***The probes feature low-capacitance design with minimal loading characteristics to preserve signal integrity. Specific capacitance values are optimised for typical digital logic voltage levels whilst maintaining proper impedance matching.
- 1564383: Can these grabbers connect to fine-pitch components and small test points?***SIMP***The grabber mechanism is designed to accommodate various test point sizes including component leads, through-hole pins, and standard PCB test points. For extremely fine-pitch components, consider specialised micro-grabber probes.
- 1564384: What voltage levels can these probes safely handle?***SIMP***The LAP-PROBE-20 probes are designed for standard digital logic voltage levels from 1.8V to 5V systems. They feature appropriate voltage tolerance and ESD protection for safe operation with typical embedded systems and digital circuits.
- 1564385: How do these grabbers compare to traditional needle probes?***SIMP***Unlike needle probes requiring manual positioning, these grabbers provide hands-free operation with spring-loaded contacts that maintain consistent connection. This eliminates measurement errors from probe movement and enables multi-channel analysis sessions.
- 1564386: What maintenance is required for these test grabbers?***SIMP***Minimal maintenance is required - simply keep contacts clean using isopropyl alcohol and inspect for mechanical wear. The robust construction ensures long service life under normal professional usage conditions.
- 1564387: Can these probes be used with other manufacturers' logic analyzers?***SIMP***Yes, whilst optimised for ZeroPlus equipment, these probes feature standard electrical characteristics compatible with most logic analyzers requiring similar impedance and voltage specifications.
- summary: Professional Test Grabbers for Precision Logic Analysis
The ZeroPlus LAP-PROBE-20 Test Grabbers represent a complete set of 20 high-quality test probes engineered specifically for logic analyzers and digital test equipment. These professional-grade grabber probes provide the reliable signal acquisition essential for electronic design engineers working on embedded systems, protocol analysis, and digital circuit debugging.
Superior Signal Integrity
Each test grabber features optimized impedance characteristics and minimal capacitive loading to ensure accurate signal capture without compromising the device under test. The probes maintain signal integrity at high frequencies whilst providing the mechanical reliability required for professional laboratory and field environments.
Hands-Free Testing Capability
Unlike traditional needle probes, these grabber-style probes secure firmly to test points, component pins, and wire connections, enabling hands-free operation during complex multi-channel logic analysis sessions. The spring-loaded mechanism ensures consistent electrical contact whilst protecting delicate components from damage.
This comprehensive set of 20 test grabbers complements the ZeroPlus logic analyzer family, including the LAP-F1 and LAP-C series, providing engineers with the complete probing solution for professional digital system validation and troubleshooting.